산업포털여기에

특징

- Measuring range : 50μS~20mS
- Applications : Silicon ingot, Silicon bulk, Prismatic shape (JIS code)
- Bulk sizes : Contact us in details

상세설명

- Minority carrier lifetime tester for silicon Ingot
  (잉곳 소수 캐리어 수명 측정장치)

- JIS direct current anodizing method

- Photoconductive decay method

- Global standard model for the lifetime test of silicon bulk

- Data processing by digital oscilloscope and PC
   (dedicated software)

특징

- Rs : 0.01~3000 Ω/sq 
 - Applications : Conductive layers on glass or film
 - Sample sizes : Contact us in details

상세설명

- Automatically measures sheet resistance

- For ITO, metal and conductive layers on film or glass

- Easy operation with PC

- System is designed for small footprint in clean room

- Non-contact Eddy current air floating single probe


* Line scan measurement video (9 point measured)*
https://www.youtube.com/watch?v=GD2IJQA0tvs&feature=player_embedded

*Point measurement video (9 point measured)*
https://www.youtube.com/watch?v=8VFKh62WyqA&feature=player_embedded

특징

- Rs:5.0mΩ/sq~10.0MΩ/sq
- Res:1.0mΩ?cm ~300kΩ?cm ( t=100~2000μm )
- Applications : Silicon wafer, conductive layer on glass/film and more
- Sample size : 2"~8"Ф, max.156mmSQ

상세설명

- All-in-one instrument of resistivity tester and measuring stage 
  (Small foot print)

- Without PC operation (stand-alone use) or PC operate system type 
   is available

- Shutter mechanism guard measurement from outside influence

- Round and square shape measuring pattern programmable
  (in use PC operate)

- Tester self-test function, wide measuring range

- Thickness, edge, temperature correction for silicon wafer

- Film thickness conversion function from sheet resistance (in use PC operate)

- Mapping software: Up to 1,225 points (Option)

특징

-Res : 10μ~100k?Ωcm
-Applications : Semiconductor materilas, Solar-cell materials (Silicon, Polysilicon, SiC etc)
                    Conductive thin film (Metal, ITO etc)
                    Others (*Please contact us for details)
-Sample sizes : φ10mm or 5mmX10mm~35mmX35mm or others

상세설명

- Controlled Thermo-chuck (room temperature～600℃/less than 20 minutes)

- 600C compatible probe head with 1mm linear

- Controlled with vacuum sensor, digital thermo-meter,
   vacuum gauge and gas flow meter

- Temperature measuring accuracy：±（0.5% + 1℃）

특징

-Thickness : 200 ?1200μm / Bow : +/-350μm / Warp : 350μm
- Applications : Semiconductor materilas, Solar-cell materials (Silicon, Polysilicon, SiC etc)
                    Silicon-related epitaxial materials, Ion-implantation sample
                    Chemical compound semiconductor (GaAs Epi, GaN Epi, InP, Ga etc) 
- Sample sizes : 3~8 inch

상세설명

- Measures Thickness, TTV, Bow, Warp and site and global Flatness (ASTM compliance)

- Measures all materials including Si, GaAs, Ge, InP, SiC

- Full 500 micron thickness measurement range without re-calibration

- 2-D /3-D Mapping software

지정된 위치로 칩을 이송시켜주는 스크류 컨베어.

저희 작업장에서 조립완료된 모습입니다.

각코일을 구동축과 직결하여 구동시키는

형식입니다.

주문제작으로 제작된 모습.

Powercut 10(수입산)

6축, 또는 7축의 다관절 이동식 측정기인 Cimcore Arm은
1.5m 부터 4.5m까지 측정 대상물의
크기와 요구 정밀도에 따라 선택할 수 있습니다.

장비의 길이에 따라 정밀도는 상이 하며 측정 프로브 교체 시에도 별도의 보정 작업이 필요 없습니다.